Boundary Scan/JTAG Testing

Non-Intrusive Structural Test for Complex, High-Reliability Assemblies

Multi-Platform JTAG Support for Diverse Test Requirements

Boundary Scan (JTAG) is a powerful, non-intrusive testing method used to verify interconnect integrity, detect structural faults, and program devices on complex PCBs—especially where physical access is limited. Ideal for densely populated, high-reliability assemblies, Boundary Scan allows engineers to isolate open pins, short circuits, and other hard-to-detect issues at the board and system level without relying on traditional probe access.

Accelerate debug, increase fault coverage, and streamline device programming with Datest’s comprehensive Boundary Scan test development and execution services—delivering precision, flexibility, and diagnostic clarity across development, production, and failure analysis stages.

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Multi-Platform JTAG Support for Diverse Test Requirements

Datest supports a wide range of applications and compatibility needs with three industry-leading JTAG platforms:

Advanced Boundary Scan Capabilities

We go beyond basic infrastructure testing (1149.1/1149.6) with advanced features and custom enhancements for boards designed with test in mind:

Testability Analysis & Platform Recommendations

Identify the optimal testing approach for your design.

Interconnect Testing

Detect opens and shorts between Boundary Scan devices.

Glue Logic Modeling

Simulate non-JTAG logic to extend interconnect paths.

Memory Connectivity Access

Ensure complete verification of memory interfaces.

Flying Probe Digital Driver/Receivers

Extend digital access using flying probe systems.

Device Programming

CPLD, FPGA, EEPROM, I2C, and SPI device programming available upon request.

Embedded Diagnostics

Gain insight into failure modes and root cause.

Advanced Boundary Scan for High-Density PCBs

Precise diagnostics in constrained environments.

When access is limited and accuracy is critical, you need more than just tools, you need a team that knows how to use them. Datest applies proven boundary scan strategies to help you reduce risk, improve coverage, and accelerate time to resolution. From early fault detection to field returns, we deliver confidence you can count on.

Boundary Scan Testing Modes

On-the-Bench Testing

Ideal for early-stage development, prototypes, or failure analysis.

Integration with Analog Flying Probe Testing

Adds digital interconnect capabilities to analog tests.

Integration with In-Circuit Testing (ICT)

Delivers efficient, high-coverage solutions for production.

Get in touch

To enquire about our Boundary Scan Testing services. Complete our online enquiry form or give us a call.

Let’s Get Started

Multi-Platform JTAG Support for Diverse Test Requirements

Accelerate debug, increase fault coverage, and streamline device programming with Datest’s comprehensive Boundary Scan test development and execution services—delivering precision, flexibility, and diagnostic clarity across development, production, and failure analysis stages.

Multi-Platform JTAG Support for Diverse Test Requirements

Advanced Boundary Scan Capabilities

Testability Analysis & Platform Recommendations

Interconnect Testing

Glue Logic Modeling

Memory Connectivity Access

Flying Probe Digital Driver/Receivers

Device Programming

Embedded Diagnostics

Advanced Boundary Scan for High-Density PCBs

Precise diagnostics in constrained environments.

Boundary Scan Testing Modes

On-the-Bench Testing

Integration with Analog Flying Probe Testing

Integration with In-Circuit Testing (ICT)

Get in touch

To enquire about our Boundary Scan Testing services. Complete our online enquiry form or give us a call.

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